IEC 61000-3-3:2013 Electromagnetic Compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection
IEC 61000-3-3 - 2013 is designed to limit the impact that voltage changes produced by electrical and electronic equipment have on public low-voltage systems. Flicker is defined by IEC as “impression of unsteadiness of visual sensation induced by a light stimulus whose luminance or spectral distribution fluctuates with time” (IEC 60050-161, 1990). The load modulation on public low-voltage lines has the potential to cause voltage fluctuations on supply lines. This standard can be purchased at the IEC Webstore. This third edition takes account of the changes made in IEC 61000-4-15:2010. EN IEC 61000-3-3 provides guidance on test equipment requirements, voltage change characteristics, assessment of flicker, source impedance, testing conditions and many other factors to be considered while conducting EMC testing.
We carry the Profline 2105, also referred to as the Teseq NSG 1007 for testing for this EMC phenomenon to EN IEC 61000-3-3. The Profline 2105 is equivalent to the California Instruments 5000ix.