Teseq NSG 3040

Rent 4.4 kV Surge 4.8 kV EFT Generator
  • 4.4 kV Surge & 4.8 EFT Immunity Test System
  • Built-in single phase CDN Max 260 V/16 A AC or DC
  • Model/Version: NSG 3040-IEC
  • Compliant to IEC and ANSI Coupling Methods 
  • Current ISO 17025 Accredited Calibration

Included Accessories

  • Conducted Immunity System
  • Control Software USB with License
  • Calibration Documentation
  • Power Cord
  • Cross Over/ Ethernet Cable
  • Printed Manual 
  • Interlock/Keeper
  • Black Plastic Screw
  • WIN3000 Installation Guide
  • Shipping Case
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Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications.

 Featuring an innovative, modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Using state-of-the-art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements.

A 7 Inch touch panel display with superb contrast and color makes controlling the NSG 3040 easy. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.

Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.

With expert mode users can make manual parameter changes using the thumbwheel while a test is underway, providing an effective and fast method for identifying critical threshold values. An easily accessible SD memory card allows firmware downloads to be performed quickly and tests to be saved. In the rare case that the storage space is not sufficient, the card can be replaced by a commercially available SD memory card and existing test files can be easily copied onto the larger SD card.

The NSG 3040 has an Ethernet port for external PC control. The Windows-based control software simplifies test programming and compilation of complex test sequences with various types of tests. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests

Combination Wave:
Pulse conforms to IEC/EN 61000-4-5
Pulse voltage (open circuit):
200 V +/- to 4.4 kV (in 1 V steps)
Pulse current (short circuit):
100 A +/- to 2.2 kA
2/12 ?
positive / negative / alternate
Pulse repetition:
10 s, up to 600 s (in 1 s steps)
Test duration:
1 to 9999 pulses, continuous
Phase synchronization:
asynchronous, synchronous 0 to 359 degrees (in 1 degree steps)
external / internal
Pulse conforms to IEC/EN 61000-4-4
Pulse amplitude:
200 V +/- to 4.8 kV (in 1 V steps) - open circuit
100 V +/- to 2.4 kV (50 ? matching system)
Burst frequency:
100 Hz to 1000 kHz
positive / negative / alternate
Repetition time:
1 ms to 4200 s (70 min)
Burst time:
1 us to 1999 s, single pulse, continuous
Test duration:
1 s to 1000 h
Phase synchronization:
asynchronous, synchronous 0 to 359 degrees (in 1 degree steps)
external / internal
Dips & drops
conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Dips & drops
From EUT voltage input to 0 V, 0%
Uvar with optional variac:
depending on model (VAR 650x)
Uvar with step transformer:
0, 40, 70, 80% (INA 650x)
Peak inrush current capability:
500 A (at 230 V
Switching times:
1 to 5 us (100 ? load)
Event time:
20 us to 1999 s, 1 to 99,999 cycles
Test duration:
1 s to 70,000 min, 1 to 99,999 events, continuous
Repetition time:
40 us to 35 min, 1 to 99,999 cycles
Phase synchronization:
asynchronous, synchronous 0 to 359 degrees (in 1 degree steps)
Internal coupling network
Decoupling attenuation
Remanent pulse 15% max.
Mains side crosstalk 15% max
Mains decoupling:
1.5 mH 0% + 35%
EUT supply:
24 to 260 Vrms, 50/60 Hz (phase - neutral), 400 Hz max.
0 to 260 VDC
EUT current
1 x 16 Arms continuous (temperature controlled)
1 x 25 Arms for 15 min
EFT (Burst)
Standard coupling all lines to ref ground (GND) IEC/EN 61000-4-4
Any lines and combinations to ref GND:
Dips & drops to phase L
Dimensions NSG 3040:
449 (17.7 Inch) x 226 (8.9 Inch; 5 HU) x 565 mm (22.2 Inch), W x H x D
Weight NSG 3040:
approx. 25 kg (55 lbs)
Video Guides
Teseq NSG 3040 Generator Overview