These pulse systems are often categorized by their waveform capabilities, levels of the associated pulses, and DUT/EUT capabilities. Systems are often capable of putting pulses on 3-Phase, data lines, etc. with the use of coupling decoupling networks (CDNs). Often times the same platform (system) has the capabilities to offer a variety of different pulses and exact configurations are depend upon the required testing needs. Another important consideration is where the pulses are being applied to. Transients can be applied to power mains, data lines, and a variety of other cables and connections associated or connected to electrical devices or equipment.
Transients are generally described as a relatively fast, quick non-repeating waveforms often caused by changes in voltage, current, or frequency often characterized by relatively fast rise or fall times on a variety of different sources. These series of pulses and (damped) oscillation waves are often produced by changes in the electrical system itself, or by connected and nearby devices. The devices associated with simulating these occurrences, transient generators, are built and designed to provide a variety of required pulses on different lines and cables to replace the real world event. The below picture provides the menu of the EM Test NX5 and associated burst pulses. The most common types of these include:
Combination wave surges (IEC 61000-4-5) and electrical fast transient (IEC 61000-4-4) are common immunity tests in many test plans. The generators associated with these pulses are often combined into a single system given that these tests are both usually done at the same time. These conducted immunity systems can also provide additional testing capabilities (Telecom, etc.) with the correct associated modules installed. these systems are usually categorized by test level and EUT CDN capabilities. To ensure compliance to IEC 61000-4-5, it is crucial to properly place pulses directly onto different positions/phase angles, often times done with automatic couplers.
Automotive and vehicle based conducted interference test systems offer capabilities to provide all 5 commonly occurring transients on a variety of different devices and components. Given the unique transient requirements and vast amount of manufacturer based standards, having the correct and up to date software is crucial to compliance. Most automotive systems are broken out either modular broken out by functionality (power supply/source, microburst/EFT generator, load dump testers, etc.) or the more easier to use approach of battery simulator/power supply and single transient system. Common conducted interference waveforms include:
Compact & Easy to use - Quick Setup & Test Routines
Variety of Standards Covered - ISO 7637, GMW3172. & Others
Capabilities & Accessories
The two different system configurations EM Test Automotive System (module system) and Teseq NSG 5500 Test System, offer different testing capabilities that can be utilized to meet a variety of testing needs. The EM Test rental systems provide the most comprehensive testing capabilities with the variety of accessories available for manufacturer based standards. These systems can be also use in conjunction with each other offering test solutions to LV124 and LV148.
Military and avionic transient generators focus around MIL-STD-461 & DO-160 series of tests, commonly MIL-STD-461 CS116, MIL-STD-461 CS117 and others. These conducted susceptibility interference standards often require damped sinusoidal wave testing as well. Given the overlap between these large EMC based standards, there is considerable overlap in both the type and level of testing that is required. Much of the military based testing requires injection of transients via current injection probes (CIP) as well as calibration prior to testing beginning. Complete test solutions will often require calibration fixtures, termination loads, and other accessories required for compliance.