Teseq NSG 3060

Teseq’s new NSG 3060 conducted immunity generator takes the proven, user-friendly design of the highly successful Modula series to a new level. This innovative design uses modular architecture to provide a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.

Designed to fulfill requirements for CE mark and ANSI C62.41 testing, the NSG 3060 performs tests for Combination wave surge, Ring wave and Electrical Fast Transient (EFT) pulses as well as Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications.

New pulse generator modules can be added to the original system quickly and easily with the NSG 3060’s unique “Master-Slave” concept. This technology allows individual pulse modules to be calibrated separately with the calibration data and correction factors stored on the slave controller. New modules can be installed with no need to return the entire system for calibration.

Using state of the art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements. With its powerful processors, the NSG 3060 can completely fulfill the unique coupling requirements specified by ANSI C62.41. This standard requires that the pulse amplitude be adjusted for the phase position of the pulse on the AC mains, and for the amplitude of the mains voltage.

A 7” touch panel display with superb contrast and color is the most striking feature of the new NSG 3060. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment.

The user-friendly graphic display speeds test setup. Each parameter’s value is highly visible and all settings can be quickly selected and modified with the generously sized touch input buttons. A stylus is not necessary, and ramp functions are programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values changed easily.

With Expert Mode users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values. The Test Assistance (TA) function allows users to initiate standardized test with just a few “clicks” to achieve quick, reliable results in a development environment.

An easily accessible SD memory card allows firmware downloads to be performed quickly and tests to be saved. In the rare case that storage space is not sufficient, the card can be replaced by a commercially available SD memory card and existing test files can be easily copied onto the larger SD card.